{"schema_version":1,"experiment_id":"eoa_inverse_innovation_exp09_archetype_breadth150_20260804","research_id":"eoa_inverse_innovation_exp09_light_prior_art_20260804","cell_id":"formal_derivation_system_design__chemistry_materials","search_lanes":{"direct_problem_and_intervention":{"queries":["thin film fabrication process sequence compatibility cumulative thermal budget layer interfaces software","semiconductor process flow formal verification state transition rules process recipe","patent thin film process sequence verification rule engine materials compatibility","process flow verification semiconductor manufacturing"],"source_ids":["SRC2","SRC3"],"no_result_note":"No exact-title or exact-phrase match was retained; phrase absence was not treated as evidence of novelty."},"synonyms_and_historical_terms":{"queries":["semiconductor process integration expert system rule based process planning","process development execution system process flow layer state traceability","formal methods manufacturing process planning verification state transitions provenance","ontology knowledge graph semiconductor process integration process flow provenance"],"source_ids":["SRC2","SRC3","SRC4"],"no_result_note":null},"products_practices_and_standards":{"queries":["XperiDesk process flow semiconductor materials layer stack process development execution system","XperiDesk rule check process flows manufacturability camLine","thin film process design rules checker material compatibility matrix process flow","semiconductor process development execution system process flow layer state traceability"],"source_ids":["SRC1","SRC3"],"no_result_note":null},"component_combination":{"queries":["thin film fabrication process flow compatibility database materials interactions thermal budget","semiconductor process flow rule checking recipe compatibility layers process sequence","software track thin film layer stack fabrication process steps","formal methods manufacturing process planning verification state transitions provenance"],"source_ids":["SRC1","SRC2","SRC4"],"no_result_note":null}},"sources":[{"source_id":"SRC1","title":"Data and Protocols","publisher":"National Institute of Standards and Technology","url":"https://www.nist.gov/mml/mmsd/data-and-ai-driven-materials-science-group/data-and-protocols","source_type":"OFFICIAL_GUIDANCE","claims_supported":["Materials process-structure-property-performance relationships create persistent data-management challenges.","Materials R&D has continuing needs for improved data interoperability, coordination, traceability, and machine-actionable data."]},{"source_id":"SRC2","title":"WO2012030930A2 — Method and apparatus for automated validation of semiconductor process recipes","publisher":"Applied Materials, Inc. filing indexed by Google Patents","url":"https://patents.google.com/patent/WO2012030930A2/ko","source_type":"OTHER","claims_supported":["A semiconductor recipe checker with stored rule sets, step-definition rules, parameter limits, and step-transition rules was disclosed by 2012.","The checker generates validation results identifying rule violations and can evaluate ordered recipe transitions, substantially overlapping sequence-level mechanical checking."]},{"source_id":"SRC3","title":"XperiDesk — Technology Development Software for R&D","publisher":"camLine / Elisa Industriq","url":"https://www.elisaindustriq.com/camline/products/xperidesk","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["A commercial process-development system already organizes semiconductor process flows, recipes, materials, units, experimental records, and data histories.","Its XperiFication module performs customizable rule-based process checks before production to assess manufacturability and prevent errors or contamination.","The product supplies traceable experiment management, knowledge reuse, virtual verification, and audit-oriented documentation."]},{"source_id":"SRC4","title":"Digitalizing Material Knowledge: A Practical Framework for Ontology-Driven Knowledge Graphs in Process Chains","publisher":"Applied Sciences (MDPI) and Fraunhofer IWM","url":"https://publica-rest.fraunhofer.de/server/api/core/bitstreams/d1f3c386-9f7b-4482-b752-c6e9818f1b20/content","source_type":"PRIMARY_RESEARCH","claims_supported":["A formal materials vocabulary, ontology, typed process parameters with units, and generic process-graph templates have been demonstrated for material-intensive process chains.","The demonstrated knowledge graph chronologically links process steps and intermediate objects, supports inference, and retrieves an object's process history.","The work digitized 278 chronologically linked process steps, showing that structured cumulative process-history representation is practical prior art."]}],"problem_evidence":{"status":"PARTLY_SUPPORTED","finding":"The sources make the general problem visible: materials-process information has persistent interoperability and coordination problems, commercial tools target repeated experiments and incorrectly defined process flows, and prior recipe checkers address limits and ordered transitions that are difficult to validate manually. The narrower assertion that two thin-film engineers commonly reach different conclusions specifically because hidden premises and cumulative layer transformations are unauditable was not directly measured in the retained sources.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"closest_prior_art":[{"name":"camLine XperiDesk with XperiCIPE, XperiFication, and XperiLink","source_ids":["SRC3"],"overlap":"Combines semiconductor process flows, recipes, materials, unit handling, reusable knowledge, data history, traceability, and pre-production rule-based consistency or manufacturability checks.","remaining_difference":"The public product description does not establish a proof-carrying transition calculus that updates every layer and interface, separates reviewed axioms from assumptions, tests premise contradictions, and emits a rule-and-premise derivation certificate for every preservation obligation."},{"name":"Applied Materials automated semiconductor process-recipe validator","source_ids":["SRC2"],"overlap":"Mechanically classifies recipe steps, checks operating-window parameters and ordered step transitions against rule sets, and reports violations.","remaining_difference":"It is tool-operating-window validation rather than an explicitly provenance-tagged multilayer-material state semantics with cumulative preservation obligations and proof traces."},{"name":"BWMD ontology and Process Graph workflow","source_ids":["SRC4"],"overlap":"Uses a formal vocabulary and semantic rules to represent typed material-process parameters, intermediate objects, chronological process chains, and inferable histories.","remaining_difference":"It structures and queries process knowledge but does not demonstrate acceptance or rejection of thin-film plans through discharged compatibility proof obligations."}],"prior_art_disposition":"SUBSTANTIAL_COLLISION","contrastive_claim_remaining":"For a fixed thin-film stack family, an explicit proof-carrying layer/interface transition semantics will produce independently checkable premise-and-rule traces for cumulative preservation judgments that are materially more complete and reproducible than XperiDesk-style rule checks or the disclosed recipe-transition validator, while retaining useful non-derivable and external-review classifications.","contrastive_claim_falsifier":"On the same frozen historical plans, an existing rule-checking workflow produces equivalent layer-state propagation, premise attribution, failed-rule localization, contradiction handling, and replayable versioned traces—or the proposed calculus cannot do so without discretionary reinterpretation, misclassifies known cases, or places most cases outside its boundary.","gates":{"adequate_source_search":{"status":"PASS","rationale":"The bounded search covered direct formulations, older expert-system and PDES terminology, commercial practices, a patent, official materials-data guidance, and combinations of ontologies, process chains, rule engines, recipe transitions, and layer histories. Exactly four opened sources from four publisher contexts were retained, including official, first-party, and primary-research sources.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"supported_problem":{"status":"PASS","rationale":"The general interoperability, coordination, traceability, manual-validation, and repeated-error problem is supported, although the proposal's specific engineer-disagreement mechanism is only partly evidenced.","source_ids":["SRC1","SRC2","SRC3"]},"distinct_testable_claim":{"status":"PASS","rationale":"After accounting for close rule-checking and semantic-process-chain prior art, a narrower comparison remains: whether proof-carrying layer-state transitions provide more complete, independently replayable premise traces and uncertainty classifications than existing rule checks.","source_ids":["SRC2","SRC3","SRC4"]},"bounded_next_test":{"status":"PASS","rationale":"A read-only retrospective comparison on no more than 12 frozen plans is bounded, reversible, and capable of measuring classification agreement, trace completeness, encoding ambiguity, out-of-scope rate, contradictions, and runtime against an existing rule-check baseline.","source_ids":["SRC3"]},"no_obvious_safety_or_authority_stop":{"status":"PASS","rationale":"The proposed first test is retrospective and read-only; it does not authorize or execute fabrication. Domain process owners and laboratory safety reviewers retain approval authority, and unsupported or contradictory cases are routed to review.","source_ids":[]}},"screen_survival":false,"world_novelty_boundary":"This bounded public-web screen found substantial functional prior art and therefore does not support screen survival. It cannot establish world novelty, patentability, freedom to operate, market size, expert acceptance, implementation feasibility beyond the proposed test, or realized fabrication value."}