{"schema_version":1,"experiment_id":"eoa_inverse_innovation_exp12_substrate_denial72_20260805","research_id":"eoa_inverse_innovation_exp12_light_screen_20260805","cell_id":"preimage_set_characterization__computer_science","search_lanes":{"direct_problem_and_intervention":{"queries":["modular chassis power supply overcurrent trip isolate shorted branch diagnostic fixture galvanically isolated channels"],"source_ids":["SRC1","SRC2"],"no_result_note":null},"synonyms_and_historical_terms":{"queries":["multiple branch circuit fault locator current threshold latching indicator DC distribution","server chassis power distribution troubleshoot short circuit current limited bench supply modules"],"source_ids":["SRC1","SRC3"],"no_result_note":null},"products_practices_and_standards":{"queries":["galvanically isolated multi-channel DC current monitoring magnetic latching indicator short circuit tester","multi-channel short circuit tester cable harness all circuits simultaneous indicator current limited","wiring harness tester simultaneous shorts opens multiple channels product","IEC 61010 current limited test equipment galvanic isolation laboratory safety official"],"source_ids":["SRC2","SRC3","SRC4"],"no_result_note":null},"component_combination":{"queries":["site:megger.com multi channel circuit breaker analyzer isolated channels current injection test","multi-channel short circuit tester cable harness all circuits simultaneous indicator current limited"],"source_ids":["SRC2","SRC3"],"no_result_note":"No retained source disclosed the complete combination of one isolated bounded-stimulus channel per populated module feeder, calibrated electromechanical dwell-threshold decisions, and a simultaneously retained numbered flag set."}},"sources":[{"source_id":"SRC1","title":"Power module transient error over current fault - Servers","publisher":"IBM","url":"https://www.ibm.com/support/pages/power-module-transient-error-over-current-fault-servers","source_type":"OFFICIAL_GUIDANCE","claims_supported":["BladeCenter power-module overcurrent can be caused by a shorted external system component or FRU.","The shared symptom is power-supply shutdown and an overcurrent event, while determining which FRU caused the short is identified as the main troubleshooting problem.","IBM's isolation procedure removes a suspected component and resets the power module, illustrating the proposal's sequential-disconnection baseline."]},{"source_id":"SRC2","title":"Hardware-Enforced PSU Protection for High-Throughput DUT Testing with MP5000","publisher":"Tektronix","url":"https://www.tek.com/en/documents/technical-brief/hardware-enforced-psu-protection-for-high-throughput-dut-testing-with-mp5000","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["A commercial modular supply provides autonomous hardware-enforced protection on individual channels.","Per-channel overcurrent protection and output-disconnect relays isolate faults while allowing unaffected channels to continue operating.","The platform supports parallel DUT testing, although status is exposed electronically through front-panel and software interfaces."]},{"source_id":"SRC3","title":"HT-128+ Handheld Wiring Analyzer","publisher":"Kinney Industries / NEXU Technologies","url":"https://www.kinneyindustries.com/ht-128-wireless-harness-tester/","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["A distributed commercial harness-test system covers complex branch connectors through product-specific adapters.","It diagnoses each wire for opens, shorts, high or low resistance, miswires, isolation, and other conditions across as many as 1,024 points.","It reports faults electronically and relies on stored test programs, networking, a user interface, and generated reports."]},{"source_id":"SRC4","title":"IEC 61010-1:2010 — Safety requirements for electrical equipment for measurement, control, and laboratory use — Part 1: General requirements","publisher":"International Electrotechnical Commission","url":"https://webstore.iec.ch/en/publication/4279","source_type":"OFFICIAL_STANDARD","claims_supported":["IEC 61010-1 applies general safety requirements to electrical test, measurement, control, and laboratory equipment and accessories.","The standard addresses insulation, mechanical and temperature hazards, foreseeable misuse, and risk assessment; testing and measuring circuits also invoke particular requirements moved to IEC 61010-2-030."]}],"problem_evidence":{"status":"SUPPORTED","finding":"IBM documents the proposed core problem in substantially the same environment: a chassis power module shuts down for overcurrent after an external FRU develops a short, yet the shutdown indication does not itself determine the failed FRU. IBM's recommended removal-and-reset procedure also makes the serial-disconnection baseline visible. The sources do not establish how often multiple qualifying feeder faults coexist, so multiplicity prevalence remains unproven.","source_ids":["SRC1"]},"closest_prior_art":[{"name":"NEXU HT-128+ distributed harness-testing system","source_ids":["SRC3"],"overlap":"Uses connector-specific adapters and scalable point coverage to test a complex harness, identifies shorts and low-resistance conditions at referenced wires, and can expose more than one wiring fault.","remaining_difference":"It is an electronic, programmed, networked analyzer that reports computed results. The retained description does not disclose independently powered identical channels attached to loaded module feeders, sustained-current dwell predicates, or one mechanical latching flag per feeder displaying the whole qualifying set without software."},{"name":"Tektronix MP5000 per-channel protected modular supply","source_ids":["SRC2"],"overlap":"Provides parallel power channels with autonomous hardware overcurrent protection and local fault isolation so a faulted DUT channel does not halt unaffected channels.","remaining_difference":"It is a programmable production-test supply whose purpose is protection and whose status is surfaced electronically. The source does not disclose exhaustive one-to-one harness-contact coverage, a common hard-short membership experiment on every feeder, or a durable mechanical flag array representing the full result set."},{"name":"IBM BladeCenter FRU isolation procedure","source_ids":["SRC1"],"overlap":"Addresses the same chassis overcurrent symptom and isolates a shorted blade or other FRU by removing it and resetting the supply.","remaining_difference":"It is sequential troubleshooting on the chassis supply, not an isolated low-energy fixture; it neither preserves simultaneous multiplicity nor audits all declared feeder contacts under one fixed stimulus."},{"name":"Combined harness-test and per-channel-protection practice","source_ids":["SRC2","SRC3"],"overlap":"The retained products collectively supply most functional ingredients: broad connector-domain testing, short/low-resistance classification, parallel channels, autonomous overcurrent response, and isolation of a faulted channel from unaffected channels.","remaining_difference":"The bounded search did not find their integration as identical isolated feeder stimuli with calibrated magnetic dwell thresholds and spatially indexed, mechanically retained flags. This is a remaining contrast, not evidence of world novelty or non-obviousness."}],"prior_art_disposition":"ADJACENT_PRIOR_ART","contrastive_claim_remaining":"For a predeclared singleton-feeder domain, the proposed cradle can test every feeder under the same voltage, polarity, current limit, dwell, and temperature band while channel isolation prevents one short from masking another, and can retain every qualifying feeder simultaneously in a numbered mechanical flag array without software. The claim is limited to membership under that stimulus, not component causation, historical-trip attribution, interaction faults, or operating-voltage behavior.","contrastive_claim_falsifier":"The contrast disappears if a dated public product, patent, paper, or service manual discloses the integrated combination of exhaustive one-channel-per-feeder coverage, independently maintained bounded stimulation, calibrated dwell-current membership thresholds, simultaneous mechanically retained per-feeder indications, and coverage references. Experimentally, it is also falsified if two simultaneous reference shorts mask one another, reference open/short states are misclassified, any declared contact is omitted, or unchanged repeats produce materially different membership.","gates":{"adequate_source_search":{"status":"PASS","rationale":"The bounded search covered the direct chassis symptom, older fault-location and harness-testing terminology, commercial harness and multichannel-supply products, an applicable safety standard, and combinations of isolation, current injection, thresholds, and retained indication. Four opened sources from four publishers were retained, including official guidance, first-party products, and an official standard.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"supported_problem":{"status":"PASS","rationale":"IBM directly documents chassis power-module overcurrent caused by a shorted external FRU and the difficulty of identifying that FRU from the common shutdown symptom.","source_ids":["SRC1"]},"distinct_testable_claim":{"status":"PASS","rationale":"Adjacent systems perform broad harness diagnosis or isolated per-channel protection, but the remaining claim is the measurable integration of equal bounded feeder stimuli, non-masking isolation, exhaustive contact coverage, and simultaneous software-independent mechanical retention.","source_ids":["SRC2","SRC3"]},"bounded_next_test":{"status":"PASS","rationale":"A four-branch non-production coupon with open, known-good, one-short, and two-simultaneous-short cases can test inclusion, exclusion, non-masking, repeatability, channel coverage, and thermal limits without energizing production hardware. Predetermined reference failures and temperature or energy limits provide clear stop conditions.","source_ids":["SRC2","SRC3"]},"no_obvious_safety_or_authority_stop":{"status":"PASS","rationale":"No obvious categorical stop appears for a de-energized, non-production, low-voltage and energy-limited coupon trial approved by the laboratory electrical-safety authority. The fixture falls within the domain of electrical test and laboratory equipment safety, so applicable IEC 61010-1 and particular measuring-circuit requirements, connector polarity, insulation, foreseeable misuse, temperature, and risk assessment must be reviewed before module testing.","source_ids":["SRC4"]}},"screen_survival":true,"world_novelty_boundary":"This coarse public-web screen establishes only that the proposal is researchable and that retained results show adjacent rather than identical practice. It cannot establish world novelty, patentability, non-obviousness, freedom to operate, market size, expert acceptance, prevalence of simultaneous branch faults, production safety compliance, or realized diagnostic value; patent databases, technical literature, legacy service fixtures, non-indexed catalogs, and jurisdiction-specific requirements remain unsearched."}