{"schema_version":1,"experiment_id":"eoa_inverse_innovation_exp12_substrate_denial72_20260805","research_id":"eoa_inverse_innovation_exp12_light_screen_20260805","cell_id":"progressive_disclosure__computer_science","search_lanes":{"direct_problem_and_intervention":{"queries":["dense PCB test points probe slip short circuit test point spacing guidance","PCB test point probe slip adjacent short diagnostic fixture","dense PCB diagnosis crowded test points accidental probe shorts layered hinged test-point fixture"],"source_ids":["SRC1","SRC2"],"no_result_note":"The search exposed the stated access and crowding problem, but did not locate an exact board-specific manual fixture using nested hinged insulating layers to disclose coarse-to-fine fan-out pads."},"synonyms_and_historical_terms":{"queries":["printed circuit board test access fan-out interface fixture guarded test points","bed of nails fixture test probe access dense PCB diagnostic breakout","multiple level test fixture PCB probes selected test points"],"source_ids":["SRC1","SRC3"],"no_result_note":null},"products_practices_and_standards":{"queries":["PCB test point design guideline probe spacing","PCB diagnostic test fixture fan out test points bed of nails manual probing","shrouded test points electrical safety fixture test probe"],"source_ids":["SRC1","SRC2","SRC4"],"no_result_note":null},"component_combination":{"queries":["hinged cover selective access electrical test terminals test points","selective access test points circuit board cover","PCB troubleshooting breakout board test points fan out fixture manual oscilloscope"],"source_ids":["SRC2","SRC3","SRC4"],"no_result_note":"The components were found separately or in adjacent combinations: accessible labeled pads, multilevel selective probe contact, and adjustable safety shrouds. No retained source combined them into the proposed manually opened, registered diagnostic hierarchy."}},"sources":[{"source_id":"SRC1","title":"Assigning Testpoints on the Board","publisher":"Altium","url":"https://www.altium.com/documentation/altium-designer/pcb/adding-testpoints","source_type":"OFFICIAL_GUIDANCE","claims_supported":["Populated boards can make pads and vias inaccessible to probes.","Test-point placement must account for minimum probe separation and clearance from components.","Hand testing, flying probes, and bed-of-nails fixtures are established access methods.","Bed-of-nails fixtures commonly expose dedicated points for many nets simultaneously."]},{"source_id":"SRC2","title":"How to Use Test Points on PCB: DFT Layout, ICT and Debug Checks","publisher":"QFPCB","url":"https://www.qfpcb.com/how-to-use-test-points-on-pcb/","source_type":"TRADE_PROFESSIONAL","claims_supported":["Large pads are easier to contact, while small pads make manual probing and fixture alignment harder.","Unlabeled or cramped points can slow manual repair.","Power, ground, reset, clock, and communication nodes are common diagnostic priorities.","Fan-out or test-access geometry can disturb high-speed, RF, clock, or sensitive analog signals and therefore requires review."]},{"source_id":"SRC3","title":"US5396186A — Vacuum actuated multiple level printed circuit board test fixture","publisher":"Google Patents / United States Patent and Trademark Office record","url":"https://patents.google.com/patent/US5396186A/en","source_type":"OTHER","claims_supported":["A PCB fixture with multiple operating levels and selected probe populations was disclosed by 1995.","Probe length and plate spacing can make one set of test points contact before additional sets.","The fixture can provide more than two levels or test modes.","Its staged access concerns automated probe-to-board contact rather than manual exposure of enlarged diagnostic pads."]},{"source_id":"SRC4","title":"Fluke TP175 TwistGuard Test Probes","publisher":"Fluke","url":"https://www.fluke.com/en/product/accessories/test-leads/tp175","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["An extendable shroud that reduces exposed probe-tip length is an established safety product feature.","The visible measurement-category rating changes with probe configuration.","The product states conformity to EN 61010-031 and publishes voltage, current, and category ratings.","Shrouding and persistent rating visibility are therefore established component practices, not distinctive aspects of the proposal."]}],"problem_evidence":{"status":"PARTLY_SUPPORTED","finding":"The problem is visible at the level of inaccessible populated-board nodes, minimum probe spacing, and slower manual work with cramped or unlabeled points. The retained sources do not provide controlled evidence that simultaneous exposure of many points specifically causes the proposed frequency of wrong-node contacts, accidental shorts, or diagnostic delay, so the full causal account is only partly supported.","source_ids":["SRC1","SRC2"]},"closest_prior_art":[{"name":"Vacuum-actuated multiple-level PCB test fixture (US5396186A)","source_ids":["SRC3"],"overlap":"Uses physical plate spacing and multiple levels to contact selected PCB test-point populations before contacting additional populations, with full-contact and partial-contact modes.","remaining_difference":"It automatically stages pogo-pin contact with the board; it does not fan nodes out to manually probed pads, organize them as a registered coarse-to-fine diagnostic hierarchy, or use hinged insulating covers to suppress irrelevant manual targets."},{"name":"Conventional dedicated test points and bed-of-nails access","source_ids":["SRC1","SRC2"],"overlap":"Provides accessible PCB nodes, larger or dedicated probe targets, clearance rules, labels, and fixture access for diagnostic or production measurements.","remaining_difference":"The accessible targets are not disclosed through nested manual layers; ordinary practice instead places selected points on the board or contacts many points through a fixture."},{"name":"Adjustably shrouded and visibly rated test probes","source_ids":["SRC4"],"overlap":"Physically limits exposed conductive probe length while keeping the applicable safety rating visible.","remaining_difference":"Protects the handheld probe rather than selectively exposing registered banks of board-specific fan-out pads."}],"prior_art_disposition":"ADJACENT_PRIOR_ART","contrastive_claim_remaining":"Against an electrically equivalent flat fan-out fixture and the known automated multilevel-contact fixture, manually opening registered insulating layers that group the same nodes from board-level to subsystem-level to component-level will reduce wrong-pad contacts and node-search time during scripted coarse-to-fine diagnosis without increasing probe obstruction, orientation loss, or full-access failures. The potentially distinct feature is the manual progressive-disclosure geometry and diagnostic grouping, not fan-out, multilevel fixtures, labeling, or shrouding individually.","contrastive_claim_falsifier":"The claim is falsified if representative technicians using the layered coupon show no practically detectable improvement over the flat coupon in wrong-pad contacts or search time, or if cover interference, wrong-layer searches, loss of orientation, unintended bridging, requested full-access events, or electrical disturbance offset any benefit.","gates":{"adequate_source_search":{"status":"PASS","rationale":"The bounded search covered the direct intervention and problem, older fixture terminology, established test-access practices, a multilevel PCB-fixture patent, and component combinations including labels, fan-out risks, covers, and shrouding. Four opened direct sources from four publisher identities were retained, including official and first-party material.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"supported_problem":{"status":"PASS","rationale":"Official and trade guidance directly establish access, spacing, and cramped-point burdens, although the proposed accidental-short and delay pathway lacks controlled quantification and is therefore only partly supported.","source_ids":["SRC1","SRC2"]},"distinct_testable_claim":{"status":"PASS","rationale":"Despite adjacent multilevel fixture art, a falsifiable contrast remains for manually exposed, registered coarse-to-fine pad banks versus an electrically equivalent flat fan-out. Outcomes can be measured without claiming novelty or a predetermined effect size.","source_ids":["SRC1","SRC2","SRC3"]},"bounded_next_test":{"status":"PASS","rationale":"A paired unpowered coupon test can hold node mapping and electrical fan-out constant while varying only layered versus flat access, recording search time, wrong contacts, cover interference, orientation loss, and full-access requests. Continuity, isolation, and added-impedance checks bound progression to current-limited low-voltage testing.","source_ids":["SRC1","SRC2","SRC3"]},"no_obvious_safety_or_authority_stop":{"status":"PASS","rationale":"No obvious stop applies to sacrificial unpowered coupons under laboratory-owner and board-engineer authority. Energized work should proceed only after continuity, isolation, signal-loading, clearance, and mechanics checks; hazardous-energy use remains excluded, and established probe practice supports physical shrouding plus visible ratings.","source_ids":["SRC2","SRC4"]}},"screen_survival":true,"world_novelty_boundary":"This bounded four-source screen supports only an adjacent-prior-art disposition and a remaining testable contrast. It cannot establish world novelty, patentability, market size, expert acceptance, realized safety, or realized diagnostic value; broader patent-family, product-catalog, standards, non-English, and practitioner searches could still reveal a closer or exact match."}