{"schema_version":1,"experiment_id":"eoa_inverse_innovation_exp12_substrate_denial72_20260805","research_id":"eoa_inverse_innovation_exp12_light_screen_20260805","cell_id":"search_space_pruning__computer_science","search_lanes":{"direct_problem_and_intervention":{"queries":["PCB fault localization thermochromic liquid crystal sheet resistive short","printed circuit board troubleshooting temperature indicating film hot spot","irreversible thermochromic film PCB fault detection","phase change temperature indicator mosaic circuit board fault localization"],"source_ids":["SRC1","SRC2","SRC4"],"no_result_note":"No exact source was found for the full combination of a replaceable paired-threshold mosaic, local calibration references, and cold-region pruning. This phrase miss is not evidence of novelty."},"synonyms_and_historical_terms":{"queries":["liquid crystal sheet locate short PCB hot spot failure analysis","temperature sensitive film circuit board fault location liquid crystal historical","electronic fault finding thermochromic paint liquid crystal board"],"source_ids":["SRC1","SRC2"],"no_result_note":null},"products_practices_and_standards":{"queries":["manufacturer irreversible temperature indicating labels multiple temperature thresholds calibration accuracy","SpotSee irreversible temperature labels multiple thresholds first party","official application note PCB fault localization thermal imaging resistive short"],"source_ids":["SRC2","SRC3","SRC4"],"no_result_note":null},"component_combination":{"queries":["patent thermochromic sheet locating short circuit printed circuit board","liquid crystal sheet locate short PCB hot spot failure analysis","manufacturer irreversible temperature indicating labels multiple temperature thresholds calibration accuracy","phase change temperature indicator mosaic circuit board fault localization"],"source_ids":["SRC1","SRC2","SRC3","SRC4"],"no_result_note":"The bounded search found the principal components separately and in adjacent combinations, but not the proposal's complete calibrated exclusion system."}},"sources":[{"source_id":"SRC1","title":"Application of lock-in thermography for failure analysis in integrated circuits using quantitative phase shift analysis","publisher":"Elsevier, with authors from Fraunhofer IWM and the Max Planck Institute of Microstructure Physics","url":"https://www-old.mpi-halle.mpg.de/mpi/publi/pdf/10941_12.pdf","source_type":"PRIMARY_RESEARCH","claims_supported":["Local heat dissipation accompanies many microelectronic faults, including shorts and resistive opens.","Liquid-crystal microscopy is a longstanding thermal fault-localization method using a foreign temperature-sensitive surface layer.","Weak sources, buried defects, and lateral heat diffusion impose sensitivity and spatial-localization limits.","Pulsed excitation and surface thermal responses can localize electrically active defects."]},{"source_id":"SRC2","title":"TLC-100 Thermochromic Liquid Crystal Kit","publisher":"Advanced Thermal Solutions, Inc.","url":"https://www.qats.com/DataSheet/TLC-100","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["A commercial thermochromic-liquid-crystal coating is expressly offered for PCB testing, heat mapping, and hot-spot or defect identification.","The coating simultaneously maps temperature fields across electronic boards through visible color changes at specified temperatures.","Different thermochromic ranges from 20°C to 120°C are available, including kits containing two ranges.","The documented process applies the coating to both the specimen and a calibration surface before powering the specimen."]},{"source_id":"SRC3","title":"Thermax Irreversible Temperature Indicators","publisher":"SpotSee","url":"https://spotsee.io/thermax/","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["Commercial self-adhesive phase-change indicators irreversibly change color when rated temperatures are exceeded.","Multi-level strips provide distinct thresholds and a permanent visual record of the highest temperature reached.","Removed labels can be retained with inspection reports.","The products establish that passive, persistent, thresholded temperature patches are an existing product class."]},{"source_id":"SRC4","title":"Precise Infrared Imaging for Printed Circuit Board Fault Detection","publisher":"Optris GmbH","url":"https://optris.com/us/application/electronics/printed-circuit-board-fault-detection/","source_type":"FIRST_PARTY_PRODUCT","claims_supported":["Locating hidden power-to-ground shorts in dense multilayer PCBs is difficult, time-consuming, and can require costly tools and expertise.","Current through unintended paths produces abnormal heat patterns that can localize PCB shorts.","Internal planes can be inaccessible to probes, while very low plane resistance can defeat voltage-drop localization.","Applying diagnostic current can cause permanent damage; the source recommends starting with the lowest current.","Small targets, optical resolution, and heat-related damage create practical limitations for thermal localization."]}],"problem_evidence":{"status":"PARTLY_SUPPORTED","finding":"The central problem is visible: dense multilayer PCB shorts can be difficult and costly to localize, inaccessible to probes, and susceptible to damage during current injection; thermal localization of shorts and resistive defects is established. The retained sources do not directly establish the narrower prevalence or behavior of intermittent board-level leakage faults that disappear when disturbed.","source_ids":["SRC1","SRC4"]},"closest_prior_art":[{"name":"Board-level thermochromic liquid-crystal heat mapping","source_ids":["SRC1","SRC2"],"overlap":"Applies a temperature-sensitive material over an electronic board or device and powers it so local phase/color responses simultaneously reveal hot spots and defects; a calibration surface and selectable temperature ranges are documented.","remaining_difference":"The disclosed coating is reversible and surface-applied rather than a replaceable, persistent tile mosaic. It does not use paired local thresholds and references to justify negative-evidence pruning."},{"name":"Thermax irreversible multi-threshold temperature labels","source_ids":["SRC3"],"overlap":"Provides adhesive phase-change elements with multiple thresholds, directly visible irreversible states, and a retainable permanent record.","remaining_difference":"It monitors maximum temperature rather than locating PCB faults, and does not disclose regional mosaics, calibration resistors, overlapping boundaries, or a conservative exclusion rule."},{"name":"Infrared thermographic PCB short localization","source_ids":["SRC1","SRC4"],"overlap":"Uses bounded electrical excitation and spatial heat signatures to narrow a short or resistive-defect location before invasive analysis.","remaining_difference":"It relies on an active optical instrument and interpreted thermal images rather than a passive persistent material record; it also does not treat calibrated absence of transition as a formal pruning criterion."}],"prior_art_disposition":"ADJACENT_PRIOR_ART","contrastive_claim_remaining":"For a prespecified fault class with validated minimum heat release and surface coupling, a replaceable mosaic can use a transitioned local reference plus an unchanged low-threshold regional patch as calibrated negative evidence to exclude that region after one energy-bounded pulse, while retaining ambiguous, boundary, and audit-sample regions. The remaining distinction is this conservative physical exclusion rule and its persistent per-region audit record—not thermochromic PCB mapping, multiple thresholds, or irreversible indicators individually.","contrastive_claim_falsifier":"In blinded coupon tests conducted within valid calibration and the prespecified safe pulse envelope, the claim is falsified if any region containing an in-scope seeded fault is classified as pruned, or if reference and paired-threshold states cannot reproducibly distinguish adequate cold evidence from insufficient exposure, poor coupling, lateral spreading, or remote heat sinking.","gates":{"adequate_source_search":{"status":"PASS","rationale":"The bounded search covered direct wording, historical liquid-crystal terminology, commercial thermal-mapping and irreversible-indicator products, active thermography practice, and combinations of these components. Exactly four opened sources from four publishers were retained, including primary research and first-party sources.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"supported_problem":{"status":"PASS","rationale":"The main localization burden and risk are directly supported, although evidence for the specifically intermittent subset is incomplete; therefore problem evidence is partly supported rather than fully supported.","source_ids":["SRC1","SRC4"]},"distinct_testable_claim":{"status":"PASS","rationale":"Adjacent art substantially anticipates thermal fault mapping and persistent threshold indicators, but the calibrated negative-evidence pruning rule remains specific and falsifiable by any valid false exclusion.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"bounded_next_test":{"status":"PASS","rationale":"A single nonfunctional gridded coupon with twelve blinded seeded conditions, prespecified pulse and threshold rules, direct-probe ground truth, and a zero-false-exclusion acceptance criterion is bounded and capable of testing the remaining claim.","source_ids":["SRC1","SRC2","SRC3","SRC4"]},"no_obvious_safety_or_authority_stop":{"status":"PASS","rationale":"No obvious stop applies to the proposed coupon-only first test under a qualified failure-analysis engineer. Current-injection damage is a known risk, but current limiting, an energy ceiling, lowest-current initiation, nonfunctional materials, and explicit halt criteria bound it. Operational, battery, medical, life-safety, pyrotechnic, and unknown-energy systems remain excluded.","source_ids":["SRC4"]}},"screen_survival":true,"world_novelty_boundary":"This bounded public-web screen establishes only coarse researchability and adjacent prior art. It cannot establish world novelty, patentability, market size, expert acceptance, realized value, or the absence of undiscovered publications, patents, products, or practices."}