The Certification of Standard Reference Material 1979¶
Cline, J. P., Mendenhall, M. H., Ritter, J. J., Black, D., Henins, A., Bonevich, J. E., Whitfield, P. S., et al. (2020). The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis. Journal of Research of the National Institute of Standards and Technology.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Scherrer Equation
- The upper usable size is instrument- and specimen-dependent rather than a universal 100 or 200 nm cutoff
This sourceA certified line-profile size standard whose report gives two different upper size limits for two different instruments on the same material, showing the accessible range to be a property of the characterized instrument rather than a fixed nanometre cutoff.
- The upper usable size is instrument- and specimen-dependent rather than a universal 100 or 200 nm cutoff
Verification¶
This reference passed the adversarial substantiation pipeline: it was checked to exist and to support the claim it is attached to. See how references were verified.
Registry ID ref:0003c294db5a · see in the full table