The Certification of Standard Reference Material 1979¶
Cline, J. P., Mendenhall, M. H., Ritter, J. J., Black, D., Henins, A., Bonevich, J. E., Whitfield, P. S., et al. (2020). The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis. Journal of Research of the National Institute of Standards and Technology.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Scherrer Equation
- The upper usable size is instrument- and specimen-dependent rather than a universal 100 or 200 nm cutoff
This sourceA certified line-profile size standard whose report gives two different upper size limits for two different instruments on the same material, showing the accessible range to be a property of the characterized instrument rather than a fixed nanometre cutoff.
SupportedVerified against the source
- The upper usable size is instrument- and specimen-dependent rather than a universal 100 or 200 nm cutoff
Verification¶
Does it exist? Confirmed. This work's DOI resolves to a registered record, which fixes its identity. That is all it fixes.
Does it back the claim? Read against the text for 1 of 1 citation: 1 supported. Each verdict is shown under its citation below, with what in the work backs the sentence.
Support is checked per citation rather than per work — the same source can be cited soundly in one article and wrongly in another. Per-citation recording began recently, so a citation with no recorded check is a gap in the record rather than evidence it went unchecked.
See how references were verified.
Registry ID ref:0003c294db5a · see in the full table