Artefacts in geometric phase analysis of compound materials¶
Peters, J. J. P., Beanland, R., Alexe, M., Cockburn, J. W., Revin, D. G., Zhang, S. Y., & Sanchez, A. M. (2015). Artefacts in geometric phase analysis of compound materials. Ultramicroscopy.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Geometric Phase Analysis
- Peters and colleagues showed that changes between compositionally distinct sublattices can add phase to the Fourier representation and appear as apparent strain even when the lattice is unstrained
This sourceEstablishes the artefact: in atomic-resolution STEM images of compound materials, compositionally distinct atom columns add a geometric phase whose change across an interface appears as strain even where there is none.
SupportedVerified against the source
- Peters and colleagues showed that changes between compositionally distinct sublattices can add phase to the Fourier representation and appear as apparent strain even when the lattice is unstrained
Verification¶
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Registry ID ref:22732e4db668 · see in the full table