Quantitative measurement of displacement and strain fields from HREM micrographs¶
Hÿtch, S., Snoeck, E., & Kilaas, R. (1998). Quantitative measurement of displacement and strain fields from HREM micrographs. Ultramicroscopy.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Geometric Phase Analysis
- Hÿtch, Snoeck, and Kilaas introduced the quantitative formulation for high-resolution electron-microscope micrographs and demonstrated that the phase of a Fourier-filtered complex image carries local atomic-plane displacement information
This sourceThe founding quantitative treatment of geometric phase analysis for HREM micrographs, cited as the source of the algorithm by the field's own implementations of it. Cited as the origin of the phase–displacement relation; the exact form and factor could not be checked against the paywalled text. Cited for the founding demonstration; the identification of the specimen could not be checked against the paywalled text.
SupportedVerified against the source
- Hÿtch, Snoeck, and Kilaas introduced the quantitative formulation for high-resolution electron-microscope micrographs and demonstrated that the phase of a Fourier-filtered complex image carries local atomic-plane displacement information
Verification¶
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Registry ID ref:2dcefaa8aaa8 · see in the full table