Built-In Testing, Design for¶
National Aeronautics and Space Administration. (1994). Built-In Testing, Design for.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Mechanisms¶
- Built-In Test Pulse
- A built-in test shares hardware, references, and firmware with the very chain it certifies, so a common-mode drift in that shared reference moves the stimulus and the response together, and the device passes itself while quietly wrong.
This sourceWarns that built-in tests sharing hardware or software with the certified chain can miss common-mode faults and falsely pass a defective device.
- A built-in test shares hardware, references, and firmware with the very chain it certifies, so a common-mode drift in that shared reference moves the stimulus and the response together, and the device passes itself while quietly wrong.
Verification¶
Does it exist? Not checked yet. This entry carries no identifier to resolve. It was extracted from the citation as written in the article, normalized, and deduplicated against the rest of the registry.
Does it back the claim? Not recorded. The single citation of this work carries no recorded support check.
Support is checked per citation rather than per work — the same source can be cited soundly in one article and wrongly in another. Per-citation recording began recently, so a citation with no recorded check is a gap in the record rather than evidence it went unchecked.
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Registry ID ref:341a150dd7bd · see in the full table