Capacitance Cell Measurement of the Out-of-Plane Expansion of Thin Films

Snyder, C. R., & Mopsik, F. I. (2001). Capacitance Cell Measurement of the Out-of-Plane Expansion of Thin Films.

Type

Report

Intellectual base

Grey literature

Year

2001

DOI

10.6028/nist.sp.960-7

Link

https://doi.org/10.6028/NIST.SP.960-7

Cited by

1 citation across 1 artifact.

Domain-specific

• Thermal Expansion
  • Metrology makes the relation operational by measuring a specimen's dimension during a controlled temperature program; NIST's thin-film practice guide emphasizes geometry, apparatus calibration, data reduction, and uncertainty rather than treating a tabulated coefficient as self-interpreting.

Verification

This reference passed the adversarial substantiation pipeline: it was checked to exist and to support the claim it is attached to. See how references were verified.

Registry ID ref:364d7629ddd8 · see in the full table