The Scherrer equation and the dynamical theory of X-ray diffraction¶
Muniz, F. T. L., Miranda, M. A. R., Morilla dos Santos, C., & Sasaki, J. M. (2016). The Scherrer equation and the dynamical theory of X-ray diffraction. Acta Crystallographica Section A Foundations and Advances.
Cited by¶
1 citation across 1 artifact.
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Domain-specific¶
- Scherrer Equation
- Muniz and colleagues showed by dynamical calculations that applicable limits depend on absorption, reflection angle, material, and perfection, with favorable high-angle cases extending well beyond common rule-of-thumb cutoffs
This sourceDerives the Scherrer equation's upper limit from dynamical diffraction theory for silicon, lanthanum hexaboride and ceria, finding validity to about 600 nm in weakly absorbing materials and near 1 micrometre at high Bragg angles.
SupportedVerified against the source
- Muniz and colleagues showed by dynamical calculations that applicable limits depend on absorption, reflection angle, material, and perfection, with favorable high-angle cases extending well beyond common rule-of-thumb cutoffs
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Registry ID ref:80128257bf96 · see in the full table