Sampling Inspection Tables¶
Dodge, H. F., & Romig, H. G. (1959). Sampling Inspection Tables: Single and Double Sampling. Wiley.
Cited by¶
1 citation across 1 artifact.
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Primes¶
- Quality Control
- This reasoning applies whether sampling a batch of semiconductors (cost of inspection ≈ microscopist time and equipment; cost of defect ≈ customer warranty and brand damage), a test suite (cost of inspection ≈ compute time; cost of defect ≈ production downtime and data loss), or a manuscript editorial review (cost of inspection ≈ reviewer time; cost of defect ≈ journal retraction, reputation loss), a cost-benefit calculus formalized in the AOQL (average outgoing quality limit) and LTPD acceptance-sampling tables that Dodge and Romig (1959) compiled for industrial inspection.
This sourceCompiles AOQL and LTPD acceptance-sampling tables developed at Bell Labs; the canonical reference for cost-benefit reasoning about sampling intensity, producer's risk, and consumer's risk in inspection plans.
- This reasoning applies whether sampling a batch of semiconductors (cost of inspection ≈ microscopist time and equipment; cost of defect ≈ customer warranty and brand damage), a test suite (cost of inspection ≈ compute time; cost of defect ≈ production downtime and data loss), or a manuscript editorial review (cost of inspection ≈ reviewer time; cost of defect ≈ journal retraction, reputation loss), a cost-benefit calculus formalized in the AOQL (average outgoing quality limit) and LTPD acceptance-sampling tables that Dodge and Romig (1959) compiled for industrial inspection.
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Registry ID ref:a2cad9911822 · see in the full table