Line broadening analysis using integral breadth methods: a critical review¶
Paolo, S., Matteo, L., & Robert, D. (2004). Line broadening analysis using integral breadth methods: a critical review: a critical review. Journal of Applied Crystallography.
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Domain-specific¶
- Scherrer Equation
- Those methods use multiple reflections or entire profiles to separate size, strain, defects, and anisotropy more explicitly
This sourceA critical review of the multi-reflection integral-breadth methods, including the Williamson-Hall variants built for dislocation strain broadening, tested against whole-powder-pattern modelling on nanocrystalline ceria and ball-milled metals; it shows what these methods separate that a single-peak estimate cannot, while judging their quantitative results generally unreliable.
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- Those methods use multiple reflections or entire profiles to separate size, strain, defects, and anisotropy more explicitly
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