Line broadening analysis using integral breadth methods: a critical review¶
Paolo, S., Matteo, L., & Robert, D. (2004). Line broadening analysis using integral breadth methods: a critical review: a critical review. Journal of Applied Crystallography.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Scherrer Equation
- Those methods use multiple reflections or entire profiles to separate size, strain, defects, and anisotropy more explicitly
This sourceA critical review of the multi-reflection integral-breadth methods, including the Williamson-Hall variants built for dislocation strain broadening, tested against whole-powder-pattern modelling on nanocrystalline ceria and ball-milled metals; it shows what these methods separate that a single-peak estimate cannot, while judging their quantitative results generally unreliable.
- Those methods use multiple reflections or entire profiles to separate size, strain, defects, and anisotropy more explicitly
Verification¶
This reference passed the adversarial substantiation pipeline: it was checked to exist and to support the claim it is attached to. See how references were verified.
Registry ID ref:a5d8df711c28 · see in the full table