A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function

Langford, J. I. (1978). A rapid method for analysing the breadths of diffraction and spectral lines using the Voigt function. Journal of Applied Crystallography.

Type

Journal article

Intellectual base

Primary research

Year

1978

DOI

10.1107/s0021889878012601

DOI registrant

International Union of Crystallography

Link

https://doi.org/10.1107/s0021889878012601

Cited by

1 citation across 1 artifact.

Each citation links to the sentence it supports in the citing article.

Domain-specific

• Scherrer Equation
  • Lorentzian breadths and Gaussian variances obey different subtraction relations; pseudo-Voigt profiles require component-aware treatment

    This sourceEstablishes the Voigt decomposition of a diffraction line into Cauchy and Gaussian components, which is why instrumental breadth must be removed component-wise rather than by subtracting a single width.

    Supported in partVerified against the source

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