Observing and measuring strain in nanostructures and devices with transmission electron microscopy¶
Hÿtch, M. J., & Minor, A. M. (2014). Observing and measuring strain in nanostructures and devices with transmission electron microscopy. MRS Bulletin.
Cited by¶
1 citation across 1 artifact.
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Domain-specific¶
- Geometric Phase Analysis
- The available components are limited to the information present in the image plane; a two-dimensional map does not by itself recover a full three-dimensional strain tensor
This sourceCited as a review of TEM strain-measurement methods; the projection limitation stated here is not in its abstract and could not be checked against the paywalled text.
- The available components are limited to the information present in the image plane; a two-dimensional map does not by itself recover a full three-dimensional strain tensor
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Registry ID ref:d1c375290ec8 · see in the full table