X-Ray Diffraction

Warren, B. E. (1990). X-Ray Diffraction.

Type

Book

Intellectual base

Review or monograph

Year

1990

Link

https://openlibrary.org/works/OL4811919W not authoritativefound

Cited by

1 citation across 1 artifact.

Each citation links to the sentence it supports in the citing article.

Domain-specific

• Scherrer Equation
  • Instrument resolution, wavelength distribution, microstrain, dislocations, stacking faults, compositional heterogeneity, and overlapping reflections can broaden or reshape the observed profile

    This sourceThe textbook treatment of the specimen and instrumental mechanisms other than domain size that broaden a powder line — the column-of-cells model, the Warren-Averbach size/strain separation, and fault broadening.

    Supported in partVerified against the source

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Verification

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Registry ID ref:eff9c65b3028 · see in the full table