X-Ray Diffraction¶
Warren, B. E. (1990). X-Ray Diffraction.
Cited by¶
1 citation across 1 artifact.
Each citation links to the sentence it supports in the citing article.
Domain-specific¶
- Scherrer Equation
- Instrument resolution, wavelength distribution, microstrain, dislocations, stacking faults, compositional heterogeneity, and overlapping reflections can broaden or reshape the observed profile
This sourceThe textbook treatment of the specimen and instrumental mechanisms other than domain size that broaden a powder line — the column-of-cells model, the Warren-Averbach size/strain separation, and fault broadening.
- Instrument resolution, wavelength distribution, microstrain, dislocations, stacking faults, compositional heterogeneity, and overlapping reflections can broaden or reshape the observed profile
Verification¶
This reference passed the adversarial substantiation pipeline: it was checked to exist and to support the claim it is attached to. See how references were verified.
Registry ID ref:eff9c65b3028 · see in the full table