Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy

Takayanagi, K., Tanishiro, Y., Takahashi, M., & Takahashi, S. (1985). Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy. Journal of Vacuum Science & Technology A, 3(3), 1502-1506.

Type

Journal article

Intellectual base

Primary research

Year

1985

Volume

3

Issue

3

Pages

1502-1506

DOI

10.1116/1.573160

Link

https://cir.nii.ac.jp/crid/1362825893484676352

Cited by

1 citation across 1 artifact.

Domain-specific

• Superstructure (condensed matter)
  • An elemental Si surface reconstruction and spin ordering in USb₂ demonstrate broader surface and magnetic uses; neither is claimed to meet the chemical split-orbit condition merely because its repeat enlarges.

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Registry ID ref:ff52171b0813 · see in the full table